Resonant probes for atomic force microscopy (AFM) can be created using shattered silicon wafers. We describe how to create silicon shards and then attach them to a quartz tuning fork for use in an AFM. The original method was described by F.J. Giessibl et. al. Copyright Mad City Labs, Inc. 2019. Keywords: atomic force microscope, AFM, SPM, tuning fork AFM, scanning probe microscope, phase lock loop controller, nanopositioning, nanopostiioner, Silicon tip, resonant probe, silicon, tuning fork, Si(111)